Memory Products
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Wafer |
DRAM | Wafer Level | Assembly PKG | |
Good Wafer | LPDDR | MCP (Add Flash + Controller) | |
Normal DDR | FBGA | ||
Low yield Wafer | FBGA | ||
Flash | Good Wafer | TSOP, Micro SD, USB Sip | |
BGA | |||
eMMC (Add Controller) | |||
MCP (Add Controller + LPDDR) | |||
Partial Wafer | BGA | ||
TSOP, Micro SD, USB Sip | |||
Low yield Wafer | TSOP, USB Sip | ||
Ink Wafer | TSOP |
Component |
DRAM | Component (Reclaim) |
MCP, BGA – Sorting – Bin 1, Bin 2 | |
Flash | TSOP, Micro SD, USB Sip |
BGA | |
eMMC (Add Controller) | |
MCP (Add Controller + LPDDR) | |
LGA** | |
Sorting: Bin 1 (full), 2 (half), 3 (quarter), 4 (eighth) |
Module,Card,SIP SSD,Embedded |
DRAM | Module (RMA) | |
Rework DDR Module – BGA (single IC) And sell to market by IC |
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Flash | Pen-Drive | Rework – TSOP or BGA And sell to market by TSOP / BGA |
SSD |
AGENDA | CONTENTS |
DRAM Components System Level Test for Module |
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AGENDA | CONTENTS (1) | CONTENTS (2) |
Failed DRAM Module RDIMM UDIMM SODIMM |
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AGENDA | CONTENTS |
Failed DRAM Module & Scrapped DRAM Package (DDR4/DDR3) |
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AGENDA | CONTENTS |
NAND FLASH, INK-DIE WAFERS and FAILED COMPONENTS & MODULES SYSTEM LEVEL TEST |
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AGENDA | CONTENTS |
NAND FLASH, INK-DIE WAFERS, LOW YIELD WAFERS, FAILED COMPONENTS & MODULES |
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CAPACITY | Mobile DRAM NAND TLC |
eMCP PACKAGE |
16Gb + 16GB | LPDDR3 16Gb/8Gb*2 NAND TLC 128Gb(16GB) |
FBGA221 |
8Gb + 16GB | LPDDR3 8Gb NAND TLC 128Gb(16GB)/ 64Gb(8GB)*2 |
FBGA221 |
8Gb + 8GB | LPDDR3 8Gb NAND MLC 64Gb(8GB) |
FBGA221 |
Product | NAND TYPE |
DENSITY | FLASH CODE | CONTROLLER |
eMCP | MLC | 32Gb | L83A | AVISTA AV8200 |
L83A | Skymedi SK6818 | |||
eMMC | MLC | 64Gb | L94C | Skymedi SK6818 |
L04A | AVISTA AV8200 | |||
TLC | 128Gb | B05A | Skymedi SK6818 | |
256Gb | B16A | AVISTA AV8200 |